IEEE executive explores sustainable data storage solutions during TUT visit TUT

Tom Coughlin, digital storage analyst and IEEE CEO, visited Tshwane University of Technology to discuss innovative, sustainable approaches to managing and storing data in the modern digital era now!

Prof Ben van Wyk, DVC for Teaching, Learning and Technology. His visit engaged students and staff from the Faculty of Engineering and the Built Environment (FEBE) and the Faculty of Information and Communication Technology (FoICT), under the auspices of TUT’s Deputy Vice-Chancellor for Teaching, Learning and Technology.

With more than 460,000 members in more than 190 countries, IEEE is recognised as the world’s largest professional association dedicated to advancing technology for humanity. Coughlin emphasised the urgent need for sustainable practices in digital storage, particularly as the demand for data storage continues to grow exponentially. 

“It is crucial to reduce the environmental impact of digital storage,” Coughlin said. He outlined IEEE's initiatives aimed at fostering a circular economy for hardware devices used in data centres, particularly digital storage solutions. One notable effort is the IEEE sustainability standard P2883, which focuses on sanitising digital storage devices to ensure complete data removal. This standard not only extends the lifespan of devices by promoting reuse but also reduces the reliance on environmentally damaging disposal methods, such as melting down old equipment.

“The process of reusing these devices allows for the extraction of valuable components, contributing to a more sustainable approach,” he added.

Dr Tom Coughlin, leading digital storage analyst and IEEE President. Prof Ben van Wyk, DVC for Teaching, Learning and Technology, remarked on the significance of Coughlin’s insights. “Dr Coughlin’s talk on creating sustainable storage devices and systems will undoubtedly provide valuable technical insights for TUT’s mission to enhance our educational offerings and produce problem-solving, future-ready graduates who are committed to sustainable development goals.” 

Dr Udochukwu Bola Akuru, Chairperson for IEEE South Africa Section and FEBE Senior Lecturer said: “TUT is honoured that Dr Coughlin visited us on his tour of selected countries in Africa. I am grateful to all who made hosting the event possible and hope we can build on the engagement and interactions we had during Tom's visit, especially towards ultimately establishing a student branch of IEEE at TUT while promoting more trademark IEEE activities focused on technical, professional and societal development within and around our community.”

IEEE President Tom Coughlin, joined by Chairperson for IEEE South Africa Section, Dr Udochukwu Bola Akuru, DVC: TL&T Prof Ben van Wyk, as well as FEBE and FoICT staff members during his visit to TUT. Dr Udochukwu Bola Akuru, Chairperson for IEEE South Africa Section and FEBE Senior Lecturer.